Radiation effects in devices and technologies - ppt download
Radiation-induced shift of the flat-band voltage for MOS capacitors due... | Download Scientific Diagram
Memory cell write unit transient response simulated in the range of... | Download Scientific Diagram
Application Note MOSFET CoolMOS™ CFD7A Cosmic radiation effects on high-voltage semiconductors in automotive onboard chargers
Radiation Hardening of Electronic Components
Electronics | Free Full-Text | Diagnosis of Faults Induced by Radiation and Circuit-Level Design Mitigation Techniques: Experience from VCO and High-Speed Driver CMOS ICs Case Studies
Radiation effects on electronics - Book chapter - IOPscience
Radiation effects on electronics - Book chapter - IOPscience
Radiation Effects on MOS Power Transistors | Semantic Scholar
Sensors | Free Full-Text | Investigation of Radiation Effects on FD-SOI Hall Sensors by TCAD Simulations
Research of transient radiation effects on FinFET SRAMs compared with planar SRAMs | Semantic Scholar
Radiation effects on electronics - Book chapter - IOPscience
Application Note MOSFET CoolMOS™ CFD7A Cosmic radiation effects on high-voltage semiconductors in automotive onboard chargers
Radiation Hardness Study on SiC Power MOSFETs
Space Radiation Effects on Electronics - Single Event Effects | Space Talos LTD
Total ionizing dose radiation effects on NMOS parasitic transistors in advanced bulk CMOS technology devices
A Quick Overview of Radiation Effects - Single Event Effects - Planet Analog
Micromachines | Free Full-Text | Thermal Impedance Characterization Using Optical Measurement Assisted by Multi-Physics Simulation for Multi-Chip SiC MOSFET Module
Space Radiation Effects on Electronics - Single Event Effects | Space Talos LTD
An overview of radiation effects on electronic devices under severe accident conditions in NPPs, rad-hardened design techniques and simulation tools - ScienceDirect
The Impact of Space Radiation Environment on Satellites Operation in Near-Earth Space | IntechOpen
Frontiers | Failure quantitative assessment approach to MOSFET power device by detecting parasitic parameters
Applied Sciences | Free Full-Text | An Improved Investigation into the Effects of the Temperature-Dependent Parasitic Elements on the Losses of SiC MOSFETs